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Propagation of Dry Etch-Induced Damage in III-V Semiconductors

Journal Defect and Diffusion Forum (Volumes 157 - 159)
Volume Diffusion in GaAs and other III-V Semiconductors
Edited by D.J. Fisher
Pages 175-190
DOI 10.4028/www.scientific.net/DDF.157-159.175
Citation Ching Hui Chen et al., 1998, Defect and Diffusion Forum, 157-159, 175
Authors Ching Hui Chen, Evelyne L. Hu
Keywords Ion Channeling, Ion-Assisted Dry Etching, Ion-Induced Damage, Multiple Quantum Wells, Radiation-Enhanced Diffusion
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