Paper Title:
Phase Defects on Si(100) Surface, Studied by Scanning Tunnelling Microscopy
  Abstract

  Info
Periodical
Defect and Diffusion Forum (Volumes 160-161)
Edited by
D.J. Fisher
Pages
57-64
DOI
10.4028/www.scientific.net/DDF.160-161.57
Citation
H. Shigekawa, K. Miyake, M. Ishida, S. Ozawa, K. Hata, "Phase Defects on Si(100) Surface, Studied by Scanning Tunnelling Microscopy", Defect and Diffusion Forum, Vols. 160-161, pp. 57-64, 1998
Online since
May 1998
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Price
$32.00
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