Defect Distribution on Epilayer/Sustrate Interfaces of ISOVPE-MCT Films |
| Journal |
Defect and Diffusion Forum (Volumes 162 - 163) |
| Volume |
Defects and Diffusion in Semiconductors |
| Edited by |
D.J. Fisher |
| Pages |
1-20 |
| DOI |
10.4028/www.scientific.net/DDF.162-163.1 |
| Citation |
U. Gilabert et al., 1998, Defect and Diffusion Forum, 162-163, 1 |
| Authors |
U. Gilabert, A.B. Trigubó, R. González, N.E. Walsöe de Reca |
| Keywords |
CdTeSe Substrates, CdZnTe Substrates, Defect Distribution, Epitaxy/Substrate Interface, Single-Crystalline CdTe, Single-Crystalline Hg1-xCdxTe MCT Films |
| Full Paper |
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