Defects in Implanted Hg1-xCdxTe: Electrical and Structural Characterization |
| Journal |
Defect and Diffusion Forum (Volumes 162 - 163) |
| Volume |
Defects and Diffusion in Semiconductors |
| Edited by |
D.J. Fisher |
| Pages |
21-26 |
| DOI |
10.4028/www.scientific.net/DDF.162-163.21 |
| Citation |
M.H. Aguirre et al., 1998, Defect and Diffusion Forum, 162-163, 21 |
| Authors |
M.H. Aguirre, H. Cánepa, E. Heredia, N.E. Walsöe de Reca |
| Keywords |
Channeling, Hall-Effect, Hg1-xCdxTe, Ion-Implantation, Radiation Defect, Rutherford Backscattering Spectrometry |
| Full Paper |
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