Defects in Implanted Hg1-xCdxTe: Electrical and Structural Characterization |
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| Journal | Defect and Diffusion Forum (Volumes 162 - 163) |
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| Volume | Defects and Diffusion in Semiconductors |
| Edited by | D.J. Fisher |
| Pages | 21-26 |
| DOI | 10.4028/www.scientific.net/DDF.162-163.21 |
| Authors | M.H. Aguirre, H. Cánepa, E. Heredia, N.E. Walsöe de Reca |
| Keywords | Channeling, Hall-Effect, Hg1-xCdxTe, Ion Implantation, Radiation Defect, Rutherford Backscattering Spectrometry |
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