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Dislocations in GaAs: Their Impact on Electronic and Atomic Processes

Journal Defect and Diffusion Forum (Volumes 162 - 163)
Volume Defects and Diffusion in Semiconductors
Edited by D.J. Fisher
Pages 27-42
DOI 10.4028/www.scientific.net/DDF.162-163.27
Citation T. Wosiński et al., 1998, Defect and Diffusion Forum, 162-163, 27
Authors T. Wosiński, T. Figielski
Keywords Ahoronov-Bohm Effect, Degradation, Energy Levels, Point Defect, Semiconductor
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