Electronic Structures of Dangling-Bond Structures Fabricated on Hydrogen-Terminated Si(100)-2 x 1 Surfaces |
| Journal |
Defect and Diffusion Forum (Volumes 162 - 163) |
| Volume |
Defects and Diffusion in Semiconductors |
| Edited by |
D.J. Fisher |
| Pages |
43-58 |
| DOI |
10.4028/www.scientific.net/DDF.162-163.43 |
| Citation |
T. Hitosugi et al., 1998, Defect and Diffusion Forum, 162-163, 43 |
| Authors |
T. Hitosugi, T. Hashizume, S. Heike, H. Kajiyama, Y. Wada, S. Watanabe, T. Hasegawa, Koichi Kitazawa |
| Keywords |
Atomic-Scale Structures, STM Manipulation Technique, Surface Defects |
| Full Paper |
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