Morphology and Defect Characterization of Epitaxial Oxide Films |
| Journal |
Defect and Diffusion Forum (Volume 164) |
| Volume |
Defects and Diffusion in Ceramics |
| Edited by |
D.J. Fisher |
| Pages |
37-56 |
| DOI |
10.4028/www.scientific.net/DDF.164.37 |
| Citation |
J. Wollschläger, 1998, Defect and Diffusion Forum, 164, 37 |
| Authors |
J. Wollschläger |
| Keywords |
Epitaxy, Growth, Low-Energy Electron Diffraction, Molecular Beam Epitaxy, Nucleation, Oxidation, Oxide Films, Scanning Tunneling Microscopy, Surface Defects, Surface Morphology |
| Full Paper |
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