IR Studies of Oxygen-Yacancy Related Defects in Irradiated Silicon |
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| Journal | Defect and Diffusion Forum (Volumes 171 - 172) |
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| Volume | Defects and Diffusion in Semiconductors |
| Edited by | D.J. Fisher |
| Pages | 1-32 |
| DOI | 10.4028/www.scientific.net/DDF.171-172.1 |
| Citation | Charalamos A. Londos et al., 1999, Defect and Diffusion Forum, 171-172, 1 |
| Authors | Charalamos A. Londos, L.G. Fytros, G.J. Georgiou |
| Keywords | Infrared Spectroscopy, Irradiation, Localised Vibrational Modes, Oxygen Impurity |
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