Paper Title:
Recent Advances in Defect Characterization in 6H-SiC Using Deep Level Transient Spectroscopy and Positron Annihilation Spectroscopy
  Abstract

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Periodical
Defect and Diffusion Forum (Volumes 183-185)
Edited by
D.J. Fisher
Pages
1-24
DOI
10.4028/www.scientific.net/DDF.183-185.1
Citation
C.C. Ling, C.D. Beling, M. Gong, X.D. Chen, S. Fung, "Recent Advances in Defect Characterization in 6H-SiC Using Deep Level Transient Spectroscopy and Positron Annihilation Spectroscopy", Defect and Diffusion Forum, Vols. 183-185, pp. 1-24, 2000
Online since
August 2000
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Price
$32.00
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