Point Defects and their Diffusion in Mercury Cadmium Telluride: Investigation Based upon High-Resolution X-Ray Diffraction |
| Journal |
Defect and Diffusion Forum (Volumes 183 - 185) |
| Volume |
Defects and Diffusion in Semiconductors |
| Edited by |
D.J. Fisher |
| Pages |
103-126 |
| DOI |
10.4028/www.scientific.net/DDF.183-185.103 |
| Citation |
N. Mainzer et al., 2000, Defect and Diffusion Forum, 183-185, 103 |
| Authors |
N. Mainzer, E. Zolotoyabko |
| Keywords |
Defect Migration, Diffusion, II-VI Semiconductors, Implantation Damage, Ion-Implantation, Lattice Parameter, Non-Destructive Characterization, Percolation Problem, Point Defect, X-Ray Diffraction (XRD) |
| Full Paper |
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