Defects and Morphologies in In0.8Ga0.2As/InAlAs/InP(001) for High Electron-Mobility Transistors |
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| Journal | Defect and Diffusion Forum (Volumes 183 - 185) |
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| Volume | Defects and Diffusion in Semiconductors |
| Edited by | D.J. Fisher |
| Pages | 147-152 |
| DOI | 10.4028/www.scientific.net/DDF.183-185.147 |
| Citation | J. Wu et al., 2000, Defect and Diffusion Forum, 183-185, 147 |
| Authors | J. Wu, F. Lin |
| Keywords | In0.8Ga0.2As/InAlAs/InP, Misfit Dislocation, Surface Morphology |
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