Paper Title:
Transmission Electron Microscopic Study of Intersecting Stacking Faults in ZnSe/GaAs(001) Epilayers and (SiGe)/Si(001) Multilayers
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Periodical
Defect and Diffusion Forum (Volumes 183-185)
Edited by
D.J. Fisher
Pages
215-230
DOI
10.4028/www.scientific.net/DDF.183-185.215
Citation
K.K. Fung, N. Wang, "Transmission Electron Microscopic Study of Intersecting Stacking Faults in ZnSe/GaAs(001) Epilayers and (SiGe)/Si(001) Multilayers", Defect and Diffusion Forum, Vols. 183-185, pp. 215-230, 2000
Online since
August 2000
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Price
$32.00
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