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Diffusion Processes in Strained Silicon Germanium Island Structures

Journal Defect and Diffusion Forum (Volumes 183 - 185)
Volume Defects and Diffusion in Semiconductors
Edited by D.J. Fisher
Pages 53-60
DOI 10.4028/www.scientific.net/DDF.183-185.53
Citation T. Walther, 2000, Defect and Diffusion Forum, 183-185, 53
Authors T. Walther
Keywords EELS, Island Formation, Segregation, Strain, TEM
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