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On the Role of Interdiffusion during the Growth of Ge on Si(001) and Si(111)

Journal Defect and Diffusion Forum (Volumes 183 - 185)
Volume Defects and Diffusion in Semiconductors
Edited by D.J. Fisher
Pages 95-102
DOI 10.4028/www.scientific.net/DDF.183-185.95
Citation R. Koch et al., 2000, Defect and Diffusion Forum, 183-185, 95
Authors R. Koch, B. Wassermann, G. Wedler
Keywords Germanium, Interdiffusion, Quantum Dot, Silicon, Strain Relaxation, Stress
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