Defects and Diffusion in Semiconductors
ISBN: 978-3-908450-54-2
- A741 Microscopic Characterization of Defects
- A742 Scanning Tunnelling Microscopy of Defects on Semiconductor Surfaces
- A743 Misfit Dislocation Generation in Epitaxial Thin Films
- A744 Forces between Cavities and Dislocations in Semiconductors
- A745 Formation of Interface Dislocations in a Finite Thickness Epilayer