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Epitaxial Growth and Defect Microstructures of Vanadium Dioxide Thin Films on Sapphire Substrates

Journal Defect and Diffusion Forum (Volumes 186 - 187)
Volume Defects and Diffusion in Ceramics
Edited by D.J. Fisher
Pages 137-0
DOI 10.4028/www.scientific.net/DDF.186-187.137
Authors Z.P. Wu
Keywords Coincidence Superlattice, Epitaxy, Rutherford Backscattering, X-Ray Diffraction (XRD)
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