Controlled Ion Migration Tuning of Semiconductor Electrical Properties |
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| Journal | Defect and Diffusion Forum (Volume 191) |
|---|---|
| Volume | Soft Chemistry leading to Novel Materials |
| Edited by | R.P. Agarwala |
| Pages | 61-98 |
| DOI | 10.4028/www.scientific.net/DDF.191.61 |
| Citation | Leonid Chernyak et al., 2001, Defect and Diffusion Forum, 191, 61 |
| Authors | Leonid Chernyak, David Cahen |
| Keywords | Electrical Property, Ion Migration Tuning, Semiconductor |
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