The Statistical Shift Model for the Meyer-Neldel Rule |
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| Journal | Defect and Diffusion Forum (Volumes 192 - 193) |
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| Volume | The Meyer-Neldel Rule |
| Edited by | D.J. Fisher |
| Pages | 1-14 |
| DOI | 10.4028/www.scientific.net/DDF.192-193.1 |
| Citation | Harald Overhof et al., 2001, Defect and Diffusion Forum, 192-193, 1 |
| Authors | Harald Overhof, Peter Thomas |
| Keywords | a-Si:H, DC Electronic Transport, Meyer-Neldel Rule, Mobility Edge, Staebler-Wronski Effect, Statistical Shift |
| Full Paper | 
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