Paper Title:
Exploring Thin-Film Reactions by Means of Simultaneous X-Ray Surface Roughness and Resistance Measurements
  Abstract

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Periodical
Defect and Diffusion Forum (Volumes 194-199)
Edited by
Y. Limoge and J.L. Bocquet
Pages
1477-1490
DOI
10.4028/www.scientific.net/DDF.194-199.1477
Citation
C. Lavoie, C. Cabral, F. M. d'Heurle, J.M.E. Harper, "Exploring Thin-Film Reactions by Means of Simultaneous X-Ray Surface Roughness and Resistance Measurements", Defect and Diffusion Forum, Vols. 194-199, pp. 1477-1490, 2001
Online since
April 2001
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Price
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