Paper Title:
The Detection of Structural Conversions in Crystallizing Thin Films of the Ta-Si System by the Method of Coherent Optical Fourier-Analysis
  Abstract

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Periodical
Defect and Diffusion Forum (Volumes 194-199)
Edited by
Y. Limoge and J.L. Bocquet
Pages
1637-1642
DOI
10.4028/www.scientific.net/DDF.194-199.1637
Citation
S. I. Sidorenko, Y.N. Makogon, V.A. Mokhort, A.A. Dziaryk, O.V. Zelenin, "The Detection of Structural Conversions in Crystallizing Thin Films of the Ta-Si System by the Method of Coherent Optical Fourier-Analysis", Defect and Diffusion Forum, Vols. 194-199, pp. 1637-1642, 2001
Online since
April 2001
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Price
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