Paper Title:
Tracer Self- Diffusion Studies in Amorphous Si-(B)-C-N Ceramics Using Ion Implantation and SIMS
  Abstract

  Info
Periodical
Defect and Diffusion Forum (Volumes 194-199)
Edited by
Y. Limoge and J.L. Bocquet
Pages
941-946
DOI
10.4028/www.scientific.net/DDF.194-199.941
Citation
H. Schmidt, G. Borchardt, H. Baumann, S. Weber, S. Scherrer, A. Müller, J. Bill, "Tracer Self- Diffusion Studies in Amorphous Si-(B)-C-N Ceramics Using Ion Implantation and SIMS", Defect and Diffusion Forum, Vols. 194-199, pp. 941-946, 2001
Online since
April 2001
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.