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Diffusion in Materials DIMAT2000

Defect and Diffusion Forum Volumes 194 - 199

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• p635 Diffusion and Solubility of Iridium in Silicon   [ 312 K ]
  Authors: S. Obeidi, Nicolaas Stolwijk
• p641 Self Interstitials, Vacancies and Oxygen Atoms in CZ Silicon   [ 161 K ]
  Authors: Takahisa Okino, Toshitada Shimozaki, Chan Gyu Lee
• p647 Preliminary Results of Numerical Profiles for the Simultaneous Diffusion of Boron and Point Defects in Silicon using Irreversible Thermodynamic Theory   [ 315 K ]
  Authors: Dao Khac An, Vu Ba Dung
• p653 Computer Calculations of the Enhanced Diffusivity and Effective Activation Energy from Measured Profiles of Impurites in Silicon   [ 357 K ]
  Authors: Dao Khac An
• p659 Diffusion of Implanted ¹⁹⁵Au Radiotracer Atoms in Amorphous Silicon under Irradiation with 1 Mev-N⁺ Ions   [ 323 K ]
  Authors: T. Voss, P. Scharwaechter, W. Frank, Isolde Collaboration
• p667 Diffusion Creep of Silicon during Direct Silicon Wafer Bonding   [ 295 K ]
  Authors: E. Belyakova, N. Shmidt, V.V. Ratnikov, Alex A. Kamanin, Eun Dong Kim, Sang Cheol Kim
• p673 Self-Assembled Impurity Superlattices and Microcavities in Silicon   [ 401 K ]
  Authors: N.T. Bagraev, A.D. Bouravleuv, W. Gehlhoff, L.E. Klyachkin, A.M. Malyarenko, S.A. Rykov
• p679 Low Temperature Impurity Diffusion into Large-Band-Gap Semiconductors   [ 349 K ]
  Authors: N.T. Bagraev, A.D. Bouravleuv, A.A. Gippius, L.E. Klyachkin, A.M. Malyarenko
• p687 Hybrid Impurity and Self-Diffusion in GaAs and Related Compounds: Recent Progress   [ 834 K ]
  Authors: Nicolaas Stolwijk, G. Bösker, J. Pöpping
• p703 Boron Diffusion in Strained and Relaxed Si_1-xGe_x   [ 357 K ]
  Authors: N.R. Zangenberg, J. Fage-Pedersen, J. Lundsgaard Hansen, Arne Nylandsted-Larsen
• p709 Phosphorus Diffusion in Si_1-x Ge_x   [ 374 K ]
  Authors: J.S. Christensen, Andrej Yu. Kuznetsov, H.H. Radamson, Bengt G. Svensson
• p717 Enhanced Diffusion Following Point Defect Injection into B in SiGe and Si   [ 394 K ]
  Authors: Arthur F.W. Willoughby, Janet M. Bonar, Aihua Dan, Barry M. McGregor
• p723 Measurements and Modeling of Zinc Diffusion Profiles in Gallium Phosphide   [ 385 K ]
  Authors: J. Pöpping, Nicolaas Stolwijk, G. Bösker, C. Jäger, W. Jäger, Ulf Södervall
• p731 Defect Formation During Zinc Diffusion in GaP   [ 613 K ]
  Authors: C. Jäger, W. Jäger, J. Pöpping, Nicolaas Stolwijk, Ulf Södervall
• p737 Microstructure of GaN Heteroepitaxial Layers after Diffusion of Mg, Zn and Au under High Pressure   [ 577 K ]
  Authors: D. Kolesnikow, Witold Łojkowski, C. Jäger, W. Jäger, M. Gastel, L.N. Paritskaya