Thick GaN Films Grown on Sapphire: Defects in Highly Mismatched Systems |
| Journal |
Defect and Diffusion Forum (Volumes 200 - 202) |
| Volume |
Defects and Diffusion in Semiconductors IV |
| Edited by |
D.J. Fisher |
| Pages |
1-28 |
| DOI |
10.4028/www.scientific.net/DDF.200-202.1 |
| Citation |
T. Paskova et al., 2001, Defect and Diffusion Forum, 200-202, 1 |
| Authors |
T. Paskova, E. Valcheva, Bo Monemar |
| Keywords |
3D Defects, Galium Nitride (GaN), Microstructure, Mismatched Systems, Point Defect |
| Full Paper |
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