Paper Title:
A Perspective from Crystal Growth and Wafer Processing on the Properties of Intrinsic Point Defects in Silicon
  Abstract

  Info
Periodical
Defect and Diffusion Forum (Volumes 200-202)
Edited by
D.J. Fisher
Pages
125-134
DOI
10.4028/www.scientific.net/DDF.200-202.125
Citation
R. J. Falster, V. V. Voronkov, "A Perspective from Crystal Growth and Wafer Processing on the Properties of Intrinsic Point Defects in Silicon", Defect and Diffusion Forum, Vols. 200-202, pp. 125-134, 2002
Online since
November 2001
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Price
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