Transmission Electron Microscopy of the Configuration of Cracks and the Defect Structure near to Cracks in Si |
| Journal |
Defect and Diffusion Forum (Volumes 200 - 202) |
| Volume |
Defects and Diffusion in Semiconductors IV |
| Edited by |
D.J. Fisher |
| Pages |
225-246 |
| DOI |
10.4028/www.scientific.net/DDF.200-202.225 |
| Citation |
Hiroyasu Saka et al., 2001, Defect and Diffusion Forum, 200-202, 225 |
| Authors |
Hiroyasu Saka, Suprijadi |
| Keywords |
Crack Tip, Dislocations, Ductile-Brittle Transition, Focused Ion Beam (FIB), Fracture, TEM |
| Full Paper |
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