Paper Title:
Transmission Electron Microscopy of the Configuration of Cracks and the Defect Structure near to Cracks in Si
  Abstract

  Info
Periodical
Defect and Diffusion Forum (Volumes 200-202)
Edited by
D.J. Fisher
Pages
225-246
DOI
10.4028/www.scientific.net/DDF.200-202.225
Citation
H. Saka, Suprijadi, "Transmission Electron Microscopy of the Configuration of Cracks and the Defect Structure near to Cracks in Si", Defect and Diffusion Forum, Vols. 200-202, pp. 225-246, 2002
Online since
November 2001
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