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EBIC/XPS Study of Antimony Equilibrium Segregation at the Germanium Surface

Journal Defect and Diffusion Forum (Volumes 200 - 202)
Volume Defects and Diffusion in Semiconductors IV
Edited by D.J. Fisher
Pages 259-0
DOI 10.4028/www.scientific.net/DDF.200-202.259
Citation N. Tabet, 2001, Defect and Diffusion Forum, 200-202, 259
Authors N. Tabet
Keywords EBIC, Germanium, Grain Boundary, Surface Segregation, X-Ray Photoelectron Spectroscopy (XPS)
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