EBIC/XPS Study of Antimony Equilibrium Segregation at the Germanium Surface |
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| Journal | Defect and Diffusion Forum (Volumes 200 - 202) |
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| Volume | Defects and Diffusion in Semiconductors IV |
| Edited by | D.J. Fisher |
| Pages | 259-0 |
| DOI | 10.4028/www.scientific.net/DDF.200-202.259 |
| Citation | N. Tabet, 2001, Defect and Diffusion Forum, 200-202, 259 |
| Authors | N. Tabet |
| Keywords | EBIC, Germanium, Grain Boundary, Surface Segregation, X-Ray Photoelectron Spectroscopy (XPS) |
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