Residual Shallow Donor- and Acceptor-Impurities in SSD- and LEC-Grown High-Purity InP Crystals |
| Journal |
Defect and Diffusion Forum (Volumes 200 - 202) |
| Volume |
Defects and Diffusion in Semiconductors IV |
| Edited by |
D.J. Fisher |
| Pages |
67-96 |
| DOI |
10.4028/www.scientific.net/DDF.200-202.67 |
| Citation |
E. Kubota et al., 2001, Defect and Diffusion Forum, 200-202, 67 |
| Authors |
E. Kubota, S. Yamada, Kotoji Ando |
| Keywords |
Annealing, Defect, Donors, FIR-PC, Impurity, InP, LEC, Passivation, PL, SSD |
| Full Paper |
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