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Internal Friction of Copper Thin Layers on Silicon Substrates

Journal Defect and Diffusion Forum (Volumes 203 - 205)
Volume Defects and Diffusion in Metals
Edited by D.J. Fisher
Pages 285-288
DOI 10.4028/www.scientific.net/DDF.203-205.285
Citation J. von der Hagen et al., 2002, Defect and Diffusion Forum, 203-205, 285
Authors J. von der Hagen, M. Weller, E. Arzt
Keywords Copper Films, Core Diffusion, Dislocation Relaxation, Internal Friction
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