Paper Title:
Structural and Electrical Study of 4H-SiC CVD-Grown Layer with Micropipe Dissociation
  Abstract

  Info
Periodical
Defect and Diffusion Forum (Volumes 206-207)
Edited by
D.J. Fisher
Pages
111-116
DOI
10.4028/www.scientific.net/DDF.206-207.111
Citation
I. Kamata, H. Tsuchida, T. Jikimoto, K. Izumi, "Structural and Electrical Study of 4H-SiC CVD-Grown Layer with Micropipe Dissociation", Defect and Diffusion Forum, Vols. 206-207, pp. 111-116, 2002
Online since
July 2002
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.