Paper Title:
Mechanical Spectroscopy of Pure and Fe-Doped InP Films on Silicon Cantilevers
  Abstract

  Info
Periodical
Defect and Diffusion Forum (Volumes 206-207)
Edited by
D.J. Fisher
Pages
179-182
DOI
10.4028/www.scientific.net/DDF.206-207.179
Citation
F.B. Klose, U. Harms, H. Neuhäuser, I. Behrens, A. Bakin, A. Schlachetzki, "Mechanical Spectroscopy of Pure and Fe-Doped InP Films on Silicon Cantilevers", Defect and Diffusion Forum, Vols. 206-207, pp. 179-182, 2002
Online since
July 2002
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.