Paper Title:
X-Ray Characterization of Nanostructured Materials
  Abstract

  Info
Periodical
Defect and Diffusion Forum (Volumes 208-209)
Edited by
W. Lojkowski
Pages
187-200
DOI
10.4028/www.scientific.net/DDF.208-209.187
Citation
R. Pielaszek, S. Gierlotka, S. Stelmakh, E. Grzanka, B. F. Palosz, "X-Ray Characterization of Nanostructured Materials", Defect and Diffusion Forum, Vols. 208-209, pp. 187-200, 2002
Online since
May 2002
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Price
$32.00
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