A Simple Method for Determining the Bascie Diffusion Parameters of Dopants using an Analytical Form of the Concentration Profile |
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| Journal | Defect and Diffusion Forum (Volumes 210 - 212) |
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| Volume | Defects and Diffusion in Semiconductors |
| Edited by | D.J. Fisher |
| Pages | 113-122 |
| DOI | 10.4028/www.scientific.net/DDF.210-212.113 |
| Citation | E. Antoncik, 2002, Defect and Diffusion Forum, 210-212, 113 |
| Authors | E. Antoncik |
| Keywords | Diffusion Coefficient, In-Diffusion, Profile, Reaction-Diffusion Equations |
| Full Paper | 
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