Defect States in InAs Quantum Dots Characterized by Photo-Induced Current Transient Spectroscopy |
|
| Journal | Defect and Diffusion Forum (Volumes 210 - 212) |
|---|---|
| Volume | Defects and Diffusion in Semiconductors |
| Edited by | D.J. Fisher |
| Pages | 81-88 |
| DOI | 10.4028/www.scientific.net/DDF.210-212.81 |
| Citation | Hoon Young Cho, 2002, Defect and Diffusion Forum, 210-212, 81 |
| Authors | Hoon Young Cho |
| Keywords | Deep Level Defect, GaAs, InAs, Molecular Beam Epitaxy, PICTS, Quantum Dot |
| Full Paper | 
Get the full paper by clicking here
|
First page example
