Stable Hydrogen Pair Trapped at Carbon Impurities in Silicon
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| Journal |
Defect and Diffusion Forum (Volumes 221 - 223) |
| Volume |
Defects and Diffusion in Semiconductors |
| Edited by |
D.J. Fisher |
| Pages |
1-10 |
| DOI |
10.4028/www.scientific.net/DDF.221-223.1 |
| Authors |
V.P. Markevich,
B. Hourahine,
R.C. Newman,
R. Jones,
Mats Kleverman,
J. Lennart Lindström,
L.I. Murin,
Masashi Suezawa,
Sven Öberg,
Patrick R. Briddon
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| Keywords |
Absorption Band, Carbon, Hydrogen, Impurity Complexes, Silicon |
| Full Paper |
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