Stable Hydrogen Pair Trapped at Carbon Impurities in Silicon |
| Journal |
Defect and Diffusion Forum (Volumes 221 - 223) |
| Volume |
Defects and Diffusion in Semiconductors |
| Edited by |
D.J. Fisher |
| Pages |
1-10 |
| DOI |
10.4028/www.scientific.net/DDF.221-223.1 |
| Citation |
Vladimir P. Markevich et al., 2003, Defect and Diffusion Forum, 221-223, 1 |
| Authors |
Vladimir P. Markevich, B. Hourahine, R.C. Newman, R. Jones, Mats Kleverman, J. Lennart Lindström, L.I. Murin, Masashi Suezawa, Sven Öberg, Patrick R. Briddon |
| Keywords |
Absorption Band, Carbon, Hydrogen, Impurity Complexes, Silicon |
| Full Paper |
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