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Modeling of Dopant and Defect Interactions in Si Process Simulators

Journal Defect and Diffusion Forum (Volumes 221 - 223)
Volume Defects and Diffusion in Semiconductors
Edited by D.J. Fisher
Pages 31-40
DOI 10.4028/www.scientific.net/DDF.221-223.31
Citation Lourdes Pelaz et al., 2003, Defect and Diffusion Forum, 221-223, 31
Authors Lourdes Pelaz, Luis Alberto Marqués, María Aboy, Juan Barbolla
Keywords Defect, Dopants, Ion-Implantation, Modeling
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