A Finite Difference Calculation of Impurity Migration in Semiconductors by the Kick-Out Mechanism |
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| Journal | Defect and Diffusion Forum (Volumes 221 - 223) |
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| Volume | Defects and Diffusion in Semiconductors |
| Edited by | D.J. Fisher |
| Pages | 89-108 |
| DOI | 10.4028/www.scientific.net/DDF.221-223.89 |
| Citation | A. Benmakhlouf, 2003, Defect and Diffusion Forum, 221-223, 89 |
| Authors | A. Benmakhlouf |
| Keywords | Diffusion, Finite Difference, Kick-Out Mechanism, Profile, Reaction-Diffusion, Surface Effects |
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