Paper Title:
Investigation of the Diffusion Behavior near Grain Boundaries for Control of the Electrical Features of Semiconducting Oxides
  Abstract

  Info
Periodical
Defect and Diffusion Forum (Volumes 226-228)
Edited by
Dr. D.J. Fisher
Pages
191-196
DOI
10.4028/www.scientific.net/DDF.226-228.191
Citation
M. B. Park, N. H. Cho, "Investigation of the Diffusion Behavior near Grain Boundaries for Control of the Electrical Features of Semiconducting Oxides", Defect and Diffusion Forum, Vols. 226-228, pp. 191-196, 2004
Online since
May 2004
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Price
$32.00
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