Imaging and Characterizing Nanoscale Fluctuations in the Distribution of Dopant Atoms by Scanning Tunneling Microscopy |
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| Journal | Defect and Diffusion Forum (Volumes 230 - 232) |
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| Volume | Defects and Diffusion in Semiconductors - An Annual Retrospective VII |
| Edited by | David J. Fisher |
| Pages | 111-124 |
| DOI | 10.4028/www.scientific.net/DDF.230-232.111 |
| Citation | Ph. Ebert, 2004, Defect and Diffusion Forum, 230-232, 111 |
| Authors | Ph. Ebert |
| Keywords | Clustering of Dopant Atoms, Dopant Mapping, Dopant-Induced Dots, Interface Roughness, Scanning Tunneling Microscopy |
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