Paper Title:
Mechanism of Formation and Physical Classification of the Grown-In Microdefects in Semiconductor Silicon
  Abstract

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Periodical
Defect and Diffusion Forum (Volumes 230-232)
Edited by
David J. Fisher
Pages
177-198
DOI
10.4028/www.scientific.net/DDF.230-232.177
Citation
V.I. Talanin, I.E. Talanin, "Mechanism of Formation and Physical Classification of the Grown-In Microdefects in Semiconductor Silicon ", Defect and Diffusion Forum, Vols. 230-232, pp. 177-198, 2004
Online since
November 2004
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