Calculating the Properties of Defects in Semiconductors at Finite Temperatures |
| Journal |
Defect and Diffusion Forum (Volumes 230 - 232) |
| Volume |
Defects and Diffusion in Semiconductors - An Annual Retrospective VII |
| Edited by |
David J. Fisher |
| Pages |
47-54 |
| DOI |
10.4028/www.scientific.net/DDF.230-232.47 |
| Citation |
Stefan Estreicher et al., 2004, Defect and Diffusion Forum, 230-232, 47 |
| Authors |
Stefan Estreicher, Mahdi Sanati |
| Keywords |
Defect, Free Energy, Impurities, Semiconductor, Silicon, Theory, Thermodynamic |
| Full Paper |
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