Paper Title:
Calculating the Properties of Defects in Semiconductors at Finite Temperatures
  Abstract

  Info
Periodical
Defect and Diffusion Forum (Volumes 230-232)
Edited by
David J. Fisher
Pages
47-54
DOI
10.4028/www.scientific.net/DDF.230-232.47
Citation
S. K. Estreicher, M. Sanati, "Calculating the Properties of Defects in Semiconductors at Finite Temperatures ", Defect and Diffusion Forum, Vols. 230-232, pp. 47-54, 2004
Online since
November 2004
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Price
$32.00
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