Paper Title:
Non-Destructive Method of Diffusion Parameters Determination in Solids
  Abstract

Diffusion of nitrogen implanted in tungsten and molybdenum single crystals has been investigated at temperature about 0.3 Tm (Tm is the melting point). Existence of several dopant atom fluxes is found in subsurface region of the ion implanted material. The diffusion coefficients of the nitrogen connected with the radiation damages and that with the bulk diffusion mechanism are determined. Change of the nitrogen surface concentration has been measured by Auger electron spectroscopy. Initial distribution of the nitrogen and diffusion profiles for various annealing time have been determined by secondary-ion mass-spectroscopy technique. Transmission electron microscopy and X-ray diffraction investigations were used to study the microstructure and phase state of the implanted samples.

  Info
Periodical
Defect and Diffusion Forum (Volumes 237-240)
Edited by
M. Danielewski, R. Filipek, R. Kozubski, W. Kucza, P. Zieba, Z. Zurek
Pages
438-443
DOI
10.4028/www.scientific.net/DDF.237-240.438
Citation
O.B. Bodnar, I.M. Aristova, A.A. Mazilkin, A.N. Chaika, L.N. Pronina, "Non-Destructive Method of Diffusion Parameters Determination in Solids", Defect and Diffusion Forum, Vols. 237-240, pp. 438-443, 2005
Online since
April 2005
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Price
$32.00
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