Elucidation of Ionic Conduction in Oxide Electrolytes by AC Method (Dielectric Relaxation Processes in La1-xSrxGa1-x+0.1Tix-0.1O3-δ) |
| Journal |
Defect and Diffusion Forum (Volumes 242 - 244) |
| Volume |
Defects and Diffusion in Ceramics - An Annual Retrospective VII |
| Edited by |
David J. Fisher |
| Pages |
115-128 |
| DOI |
10.4028/www.scientific.net/DDF.242-244.115 |
| Citation |
Eisuke Iguchi et al., 2005, Defect and Diffusion Forum, 242-244, 115 |
| Authors |
Eisuke Iguchi, Masamori Kurumada, Shinsuke Mochizuki |
| Keywords |
AC Measurements, Dielectric Relaxation Process, Doped Excess Oxygen Vacancies, Ionic Conduction, La1-xSrxGa1-x+0.1Tix-0.1O3-δ, Migration Energy, O2- Migration, Oxide Electrolytes, Perovskite Structure, Relaxation Time |
| Full Paper |
Get the full paper by clicking here
|
