Elucidation of Ionic Conduction in Oxide Electrolytes by AC Method (Dielectric Relaxation Processes in La1-xSrxGa1-x+0.1Tix-0.1O3-δ) |
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| Journal | Defect and Diffusion Forum (Volumes 242 - 244) |
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| Volume | Defects and Diffusion in Ceramics - An Annual Retrospective VII |
| Edited by | David J. Fisher |
| Pages | 115-128 |
| DOI | 10.4028/www.scientific.net/DDF.242-244.115 |
| Authors | Eisuke Iguchi, Masamori Kurumada, Shinsuke Mochizuki |
| Keywords | AC Measurements, Dielectric Relaxation Process, Doped Excess Oxygen Vacancies, Ionic Conduction, La1-xSrxGa1-x+0.1Tix-0.1O3-δ, Migration Energy, O2- Migration, Oxide Electrolytes, Perovskite Structure, Relaxation Time |
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