Paper Title:
Determination of Copper Self-Diffusion Coefficients on the Base of High-Temperature Creep Data
  Abstract

Indirect method is used for determination of copper self-diffusion coefficient on the base of high-temperature creep data. These data are obtained by the use of the new measuring device and assuming that Nabarro-Herring mechanism acts.

  Info
Periodical
Edited by
B.S. Bokstein and B.B. Straumal
Pages
115-118
DOI
10.4028/www.scientific.net/DDF.249.115
Citation
D. V. Vaganov, S. N. Zhevnenko, "Determination of Copper Self-Diffusion Coefficients on the Base of High-Temperature Creep Data", Defect and Diffusion Forum, Vol. 249, pp. 115-118, 2006
Online since
January 2006
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