Materials Science & Technology

FULLTEXT SEARCH
NEW: Advanced Search

Direct Force Controversy in Electromigration Exit

Journal Defect and Diffusion Forum (Volumes 261 - 262)
Volume Defects and Diffusion in Semiconductors - An Annual Retrospective IX
Edited by David J. Fisher
Pages 77-84
DOI 10.4028/www.scientific.net/DDF.261-262.77
Citation A. Lodder, 2007, Defect and Diffusion Forum, 261-262, 77
Online since January, 2007
Authors A. Lodder
Keywords Controversy, Direct Force, Electromigration, Multiple-Scattering Effects
Full Paper PDF Get the full paper by clicking here

First page example

Preview of first page