Intermixing in Cu/Co: Molecular Dynamics Simulations and Auger Electron Spectroscopy Depth Profiling |
| Journal |
Defect and Diffusion Forum (Volume 264) |
| Volume |
Diffusion and Stresses |
| Edited by |
D. L. Beke, Z. Erdélyi and I. A. Szabó |
| Pages |
19-26 |
| DOI |
10.4028/www.scientific.net/DDF.264.19 |
| Citation |
Péter Süle et al., 2007, Defect and Diffusion Forum, 264, 19 |
| Online since |
April, 2007 |
| Authors |
Péter Süle, Miklós Menyhárd |
| Keywords |
Atomistic Computer Simulation, Auger Electron Spectroscopy (AES), Cu/Co, Depth Profiling, Ion-Solid Interaction, Ion-Sputtering, Molecular Dynamics (MD), Multilayer, Sputter Removal, Thin Film |
| Full Paper |
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