Paper Title:

Defects Removal Using a Triangular-Shape Designed Tool

Periodical Defect and Diffusion Forum (Volumes 297 - 301)
Main Theme Diffusion in Solids and Liquids V
Edited by Andreas Öchsner, Graeme E. Murch, Ali Shokuhfar and João M.P.Q. Delgado
Pages 203-208
DOI 10.4028/www.scientific.net/DDF.297-301.203
Citation Pai Shan Pa, 2010, Defect and Diffusion Forum, 297-301, 203
Online since April, 2010
Authors Pai Shan Pa
Keywords Defect, Displays’ Color Filter, ITO Thin Film, Microelectromechanical Etching, Precision Reclamation, Tool Design, Triangular-Shape
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A new triangular-shape designed tool as a cathode in microelectromechanical etching process is a precision nanoscale production of a reclamation system of Indium tin oxide (ITO) thin-films defects removal from optoelectronic flat panel displays’ color filter surface is demonstrated in the current study. Through the ultra-precise removal of the thin-film nanostructure, the optoelectronic semiconductor industry can effectively reclaim defective products, reducing production costs. In the current experiment, a large size triangular shape cathode is accompanied by a small gap-width between the cathode and the workpiece takes less time for the same amount of ITO removal. A higher feed rate of displays’ color filter or a small end radius of the cathode combined with enough electric power produces fast machining. Pulsed direct current can improve the effect of dregs discharge and is advantageous in association with a fast workpiece feed rate. However, it raises the current rating. A large flow rate of the electrolyte corresponds to a higher removal rate for the ITO nanostructure. The electrochemical etching just needs a short time to make the ITO remove removal easy and clean.

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