Defects Removal Using a Triangular-Shape Designed Tool
| Periodical | Defect and Diffusion Forum (Volumes 297 - 301) |
|---|---|
| Main Theme | Diffusion in Solids and Liquids V |
| Edited by | Andreas Öchsner, Graeme E. Murch, Ali Shokuhfar and João M.P.Q. Delgado |
| Pages | 203-208 |
| DOI | 10.4028/www.scientific.net/DDF.297-301.203 |
| Citation | Pai Shan Pa, 2010, Defect and Diffusion Forum, 297-301, 203 |
| Online since | April, 2010 |
| Authors | Pai Shan Pa |
| Keywords | Defect, Displays’ Color Filter, ITO Thin Film, Microelectromechanical Etching, Precision Reclamation, Tool Design, Triangular-Shape |
| Price | US$ 28,- |
A new triangular-shape designed tool as a cathode in microelectromechanical etching process is a precision nanoscale production of a reclamation system of Indium tin oxide (ITO) thin-films defects removal from optoelectronic flat panel displays’ color filter surface is demonstrated in the current study. Through the ultra-precise removal of the thin-film nanostructure, the optoelectronic semiconductor industry can effectively reclaim defective products, reducing production costs. In the current experiment, a large size triangular shape cathode is accompanied by a small gap-width between the cathode and the workpiece takes less time for the same amount of ITO removal. A higher feed rate of displays’ color filter or a small end radius of the cathode combined with enough electric power produces fast machining. Pulsed direct current can improve the effect of dregs discharge and is advantageous in association with a fast workpiece feed rate. However, it raises the current rating. A large flow rate of the electrolyte corresponds to a higher removal rate for the ITO nanostructure. The electrochemical etching just needs a short time to make the ITO remove removal easy and clean.