Paper Title:
Optical and Mechanical Properties of Aluminum Film Deposited on Glass Substrate
  Abstract

The aluminum film with high reflectivity and low absorption in the visible wavelength region has been widely used in optical applications. In this investigation, aluminum films were prepared on glass substrates by electron-beam vapor deposition. The reflectivity of the Al thin film was measured by a Perkin-Elmer Lambda spectrophotometer in the wavelength region of 450-680 nm. The experimental measurements of reflectivity were validated with the numerical results using the Essential Macleod software. The surface topology and microstructure of the film were examined by means of atomic force microscope (AFM). The effects of the temperature and humidity on the reflectivity of the Al film were examined by the environmental test. Nanoindentation tests were employed to determine the hardness and Young’s modulus of the film. The measured hardness of the Al thin films were found to depend on the penetration depth.

  Info
Periodical
Defect and Diffusion Forum (Volumes 297-301)
Edited by
Andreas Öchsner, Graeme E. Murch, Ali Shokuhfar and João M.P.Q. Delgado
Pages
444-449
DOI
10.4028/www.scientific.net/DDF.297-301.444
Citation
S. C. Her, Y. H. Wang, "Optical and Mechanical Properties of Aluminum Film Deposited on Glass Substrate", Defect and Diffusion Forum, Vols. 297-301, pp. 444-449, 2010
Online since
April 2010
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Price
$32.00
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