Paper Title:
Investigation of Thermal Properties of Thin Semiconductor Layers Deposited on a Glass Substrate by the Photothermal Deflection Technique
  Abstract

In this work we describe a method based on the Photothermal Deflection Technique adapted for the determination of thermal properties of thin semiconductor layers deposited on a glass substrate. The sample placed in air is heated thanks a modulated pump uniform beam coming from a halogen lamp. The thermal conductivity and the thermal diffusivity are obtained by comparing the amplitude and phase variations versus square root modulation frequency between the experimental curves and the corresponding theoretical ones. The best coincidence permits to deduce the thermal properties of the sample.

  Info
Periodical
Defect and Diffusion Forum (Volumes 297-301)
Edited by
Andreas Öchsner, Graeme E. Murch, Ali Shokuhfar and João M.P.Q. Delgado
Pages
537-542
DOI
10.4028/www.scientific.net/DDF.297-301.537
Citation
I. Gaied, M. B. Rabeh, A. Rabhi, M. Kanzari, N. Yacoubi, "Investigation of Thermal Properties of Thin Semiconductor Layers Deposited on a Glass Substrate by the Photothermal Deflection Technique ", Defect and Diffusion Forum, Vols. 297-301, pp. 537-542, 2010
Online since
April 2010
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