Paper Title:
Recent Developments in the Study of Grain Boundary Segregation by Wavelength Dispersive X-Ray Spectroscopy (WDS)
| Periodical | Defect and Diffusion Forum (Volumes 309 - 310) |
|---|---|
| Main Theme | Grain Boundary Diffusion, Stresses and Segregation |
| Edited by | B.S. Bokstein, A.O. Rodin and B.B. Straumal |
| Pages | 39-44 |
| DOI | 10.4028/www.scientific.net/DDF.309-310.39 |
| Citation | Pawel Nowakowski et al., 2011, Defect and Diffusion Forum, 309-310, 39 |
| Online since | March, 2011 |
| Authors | Pawel Nowakowski, Frédéric Christien, Marion Allart, René Le Gall |
| Keywords | Characterization Method, Electron-Beam, EPMA, Grain Boundary Segregation, Monolayer, Quantification, Scanning Electron Microscope (SEM), Spectroscopic Technique, Wavelength Dispersive X-Ray Spectroscopy (WDS) |
| Price | US$ 28,- |
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Abstract
It was recently shown [1] that EMPA-WDS (Electron Probe MicroAnalysis by Wavelength Dispersive X-ray Spectroscopy) can be used to detect and to accurately quantify monolayer surface and grain boundary segregation. This paper presents the last developments of this application. It focuses on the measurement of sulphur grain boundary segregation in nickel on fractured surfaces. A special attention was paid to the quantification of the sulphur coverage, taking into account the non-normal incidence of the electron beam on a fracture surface. Sulphur grain boundary segregation kinetics was measured at 750°C in nickel to document the quantitative possibilities of the technique.
