Paper Title:

Physics on the Top of the Tip: Atomic Transport and Reaction in Nano-Structured Materials

Periodical Defect and Diffusion Forum (Volumes 323 - 325)
Main Theme Diffusion in Materials - DIMAT 2011
Edited by I. Bezverkhyy, S. Chevalier and O. Politano
Pages 3-10
DOI 10.4028/www.scientific.net/DDF.323-325.3
Citation Guido Schmitz et al., 2012, Defect and Diffusion Forum, 323-325, 3
Online since April, 2012
Authors Guido Schmitz, Dietmar Baither, Zoltán Balogh, Mohammed Reda Chellali, Gerd Hendrik Greiwe, Michael Kasprzak, Christian Oberdorfer, Ralf Schlesiger, Patrick Stender
Keywords Anomalous Diffusion, Atom Probe Tomography, Diffusion Induced Recrystallisation, Grain Boundary (GB), Nanoscale Diffusion, Reaction, Triple Junctions
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Abstract

Nanoscale systems show a wide variety of physical properties that cannot be observed in the bulk. Using atom probe tomography, it is possible to study nanostructured materials with almost atomic resolution in all three dimensions. In this article, we will present a short review of the latest atom-probe measurements carried out at University of Münster with particular focus on diffusion and segregation measurements in triple junctions and interface analysis.